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searching for Soft error 10 found (37 total)

alternate case: soft error

Theta (musician) (475 words) [view diff] case mismatch in snippet view article

Virus Battle 3: Hendra Vs Black Death (HgM) 2020 Θ - isolation frequency (Soft Error) 2019 Θ (theta) - distract (dead media recordings) 2019 Θ (theta) - requiem
Photodiode (3,411 words) [view diff] exact match in snippet view article find links to article
impurities in packaging materials were found to be the dominant cause of [soft error rate] in [dynamic random-access memories]. Erzberger, Arno (2016-06-21)
Dark silicon (552 words) [view diff] exact match in snippet view article find links to article
community. In particular, they have demonstrated thermal, reliability (soft error and aging), and process variation concerns for dark silicon many-core
MIL-STD-883 (827 words) [view diff] exact match in snippet view article find links to article
Preseal burn-in 1031 Thin film corrosion test 1032.1 Package induced soft error test procedure 1033 Endurance life test 1034.1 Die penetrant test 2001
SpaceX Dragon (7,821 words) [view diff] exact match in snippet view article find links to article
instantiate a fault-tolerant design. In the event of a radiation upset or soft error, one of the computer pairs will perform a soft reboot. Including the flight
Key Code Qualifier (209 words) [view diff] case mismatch in snippet view article find links to article
Condition No Sense 0 00 00 No error 0 5D 00 No sense - PFA threshold reached Soft Error 1 01 00 Recovered Write error - no index 1 02 00 Recovered no seek completion
Immunity-aware programming (3,947 words) [view diff] exact match in snippet view article find links to article
duplicate a test is one of the most robust methods that exists for generic soft error detection. A drawback is that no strict assumption on the cause of the
The Svedberg Laboratory (1,676 words) [view diff] case mismatch in snippet view article find links to article
the Cosmic ray induced neutron field. Designed for Single Event Effects/Soft Error Rate testing. Neutron beam with spectrum that resembles the one in the
List of fellows of IEEE Circuits and Systems Society (57 words) [view diff] no match in snippet view article find links to article
wireless communications 2008 Eishi Ibe For contributions to neutron-induced soft-error analysis for semiconductor memory devices 2008 Ming-dou Ker For contributions
List of fellows of IEEE Electron Devices Society (57 words) [view diff] no match in snippet view article find links to article
and imaging devices 2008 Eishi Ibe For contributions to neutron-induced soft-error analysis for semiconductor memory devices 2008 Ming-dou Ker For contributions