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searching for Focused ion beam 31 found (103 total)

Foveola (396 words) [view diff] exact match in snippet view article find links to article

recently reinvestigated. Serial semithin and ultrathin sections, and focused ion beam (FIB) tomography were prepared from 32 foveolae from monkeys (Macaca

Probe tip (8,212 words) [view diff] exact match in snippet view article find links to article

then sharpened by FIB milling as shown in Fig. 8. The diameter of the focused ion beam, which directly affects the tip's final diameter, is controlled through

Nanoneedle (640 words) [view diff] exact match in snippet view article find links to article

The 100 nm diameter needles were cut from silicon AFM tips using focused ion beam etching. In 2009, researchers at the University of Illinois produced

Max Planck Institute of Biochemistry (633 words) [view diff] case mismatch in snippet view article find links to article

Bioinformatics (Jürgen Cox) CryoEM Technology: Cryo-Electron Tomography, Focused Ion Beam Milling, correlated light microscopy, in situ Structural Biology, visual

Optical beam-induced current (362 words) [view diff] exact match in snippet view article find links to article

shorts. The OBIC technique may be used to detect the point at which a focused ion beam (FIB) milling operation in bulk silicon of an IC must be terminated

MEMS (5,604 words) [view diff] no match in snippet view article find links to article

the pattern is not being changed the second time. It is known that focused-ion beam lithography has the capability of writing extremely fine lines (less

Namiki Precision Jewel Co (410 words) [view diff] case mismatch in snippet view article find links to article

html Control of Nano-Step Structures on Sapphire Wafer Surface by Focused Ion Beam Processing (in Japanese). National Institute of Informatics. Retrieved

Russell Berrie Nanotechnology Institute (895 words) [view diff] case mismatch in snippet view article find links to article

and advanced facilities for sample preparation including the Dual Focused Ion Beam.[citation needed] There is now also a new cryo TEM and a new high resolution

Deep reactive-ion etching (1,454 words) [view diff] exact match in snippet view article find links to article

used as etch mask in cryo-DRIE. Combined nanofabrication process of focused ion beam and cryo-DRIE was first reported by N Chekurov et al in their article

Magnetic force microscope (2,376 words) [view diff] case mismatch in snippet view article find links to article

History of Probing Methods L. Gao; L.P. Yue; T. Yokota; et al. (2004). "Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain

Adamant Namiki Precision Jewel Co (706 words) [view diff] case mismatch in snippet view article find links to article

025502. "Control of Nano-Step Structures on Sapphire Wafer Surface by Focused Ion Beam Processing". The Ceramic Society of Japan. "Transfer of LTCC Business

Nanorod (1,865 words) [view diff] exact match in snippet view article find links to article

array light-emitting diodes can be manufactured with dry etching or focused ion beam etching techniques. Such LEDs emit polarized blue or green light Three-dimensional

Secondary ion mass spectrometry (2,250 words) [view diff] exact match in snippet view article find links to article

alloys which lower their melting points. The LMIG provides a tightly focused ion beam (<50 nm) with moderate intensity and is additionally able to generate

Avizo (software) (6,143 words) [view diff] exact match in snippet view article

characterization of a solid oxide fuel cell anode reconstructed by focused ion beam tomography" (PDF). Journal of Power Sources. 196 (18): 7541–7549. Bibcode:2011JPS

Industrial applications of nanotechnology (3,849 words) [view diff] case mismatch in snippet view article find links to article

Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB). This has come about as a side benefit of the development of

Songi Han (714 words) [view diff] case mismatch in snippet view article find links to article

2022-08-29. "Beckman Foundation Awards Funding to Advance Research Using Focused Ion Beam (FIB) Milling of Cellular Samples". PRWeb. Retrieved 2022-08-29. "Prizes:

Nanofluidics (2,322 words) [view diff] exact match in snippet view article find links to article

Carl Zeiss Crossbeam 550 - combines a field emission scanning electron microscope (FE-SEM) with a focused ion beam (FIB).

List of fellows of IEEE Consumer Electronics Society (66 words) [view diff] exact match in snippet view article find links to article

Nicholas Economou For leadership in developing and commercializing focused ion beam systems 2010 Peter Corcoran For contributions to digital camera technologies

Three-dimensional X-ray diffraction (1,266 words) [view diff] case mismatch in snippet view article find links to article

Raabe, D. (2008-02-01). "Three-Dimensional Orientation Microscopy in a Focused Ion Beam–Scanning Electron Microscope: A New Dimension of Microstructure Characterization"

Stefan Raunser (2,117 words) [view diff] exact match in snippet view article find links to article

the group has developed a streamlined workflow for automated cryo-focused ion beam milling for the analysis of vitrified samples by electron cryo tomography

Gas vesicle (2,713 words) [view diff] exact match in snippet view article find links to article

concentration of NaCl. (C) Cryo-transmission electron micrograph of a focused ion beam-thinned cell in 3 M NaCl plus 81 mM MgSO4. The periodicity of the gas

MEMS for in situ mechanical characterization (2,026 words) [view diff] exact match in snippet view article find links to article

pillars using nanoindentation of microfabricated samples by means of focused ion beam. Later on, Taher Saif at University of Illinois- Urbana Champaign can

Rutherford backscattering spectrometry (3,861 words) [view diff] exact match in snippet view article find links to article

predictions. RBS has also been combined with nuclear microscopy, in which a focused ion beam is scanned across a surface in a manner similar to a scanning electron

Single-entity electrochemistry (1,321 words) [view diff] no match in snippet view article find links to article

ISSN 2451-9103. Chen, R.; Hu, K. K.; Yu, Y.; Mirkin, M. V.; Amemiya, S. Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy

Phonon polariton (2,527 words) [view diff] no match in snippet view article find links to article

(2004-08-01). "Subwavelength-scale tailoring of surface phonon polaritons by focused ion-beam implantation". Nature Materials. 3 (9): 606–609. Bibcode:2004NatMa

List of fellows of IEEE Electron Devices Society (69 words) [view diff] exact match in snippet view article find links to article

microelectronics packaging 1999 Andrew Steckl For contributions to focused ion beam implantation and semiconductor device fabrication 1999 Dwight Streit

Neurovascular unit (4,369 words) [view diff] exact match in snippet view article find links to article

"Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling". The Journal of Neuroscience. 28 (12): 2959–2964. doi:10.1523/JNEUROSCI

Single-walled carbon nanohorn (7,074 words) [view diff] exact match in snippet view article find links to article

structure of SWNHs was examined by electron microscopy observations after focused ion beam (FIB) cutting. It was revealed that the interior consists of disordered

List of fellows of IEEE Engineering in Medicine and Biology Society (53 words) [view diff] exact match in snippet view article find links to article

devices and safety standards. 1999 Steckl, Andrew For contributions to focused ion beam implantation and semiconductor device fabrication. 2000 Ermert, Helmut

2018 in paleobotany (14,958 words) [view diff] case mismatch in snippet view article find links to article

compressions of Early Jurassic plants from Argentinian Patagonia, using Focused Ion Beam Scanning Electron Microscopy, is published by Sender et al. (2018)

White etching cracks (3,422 words) [view diff] exact match in snippet view article find links to article

(2013-09-01). "White etching crack (WEC) investigation by serial sectioning, focused ion beam and 3-D crack modelling". Tribology International. 39th LEEDS-LYON