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Find link is a tool written by Edward Betts.Longer titles found: Nanoscale secondary ion mass spectrometry (view)
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Alfred Benninghoven
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mass spectrometry researcher known for his work on static secondary ion mass spectrometry. Benninghoven graduated from the University of Cologne in 1961Peter M. Fischer (2,576 words) [view diff] case mismatch in snippet view article find links to article
67-104. Canaanite potteryfrom Hala Sultan Tekke: Analysis with Secondary Ion Mass Spectrometry (SIMS). Bronze Age Trade in the Mediterranean; ed. N.H.GaleSally McArthur (550 words) [view diff] exact match in snippet view article find links to article
(1 January 2002). "Limits of detection for time of flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS): detectionPlummer effect (669 words) [view diff] case mismatch in snippet view article find links to article
Iodine: Analysis Using X-Ray Fluorescence and Time-of-Flight Secondary Ion Mass Spectrometry". Case Reports in Endocrinology. 2012: 842357. doi:10.1155/2012/842357Enrico Fermi Institute (358 words) [view diff] exact match in snippet view article find links to article
General relativity; Electron microscopy; Ion microscopy and secondary ion mass spectrometry; Nonimaging optics and solar energy concentration; GeochemistryGas cluster ion beam (1,701 words) [view diff] exact match in snippet view article find links to article
sources are increasingly used for analytical depth-profiling by secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS). Argon clustersJohn W. Valley (2,145 words) [view diff] case mismatch in snippet view article find links to article
in professional service. In 2005, he founded the Wisconsin Secondary Ion Mass Spectrometry Laboratory (WiscSIMS) to develop new methods for measuringIconography of correlations (701 words) [view diff] exact match in snippet view article find links to article
23 March 2006]. "Chemometric evaluation of time-of-flight secondary ion mass spectrometry data of minerals in the frame of future in situ analyses ofChi Ming Chan (534 words) [view diff] case mismatch in snippet view article find links to article
"Application of X-ray Photoelectron Spectroscopy and Static Secondary Ion Mass Spectrometry in Surface Characterization of Copolymers and Polymer Blends"Astarte borealis (1,333 words) [view diff] exact match in snippet view article find links to article
borealis (Bivalvia) from the southwestern Baltic Sea using secondary ion mass spectrometry". Marine Biology. 168 (8): 133. Bibcode:2021MarBi.168..133MRussell Berrie Nanotechnology Institute (895 words) [view diff] case mismatch in snippet view article find links to article
Field Scanning Optical Microscope (NSOM), and Time of Flight Secondary Ion Mass Spectrometry (TOFSIMS) are now also available. Colloidal and molecular characterizationMolecular engineering (1,932 words) [view diff] case mismatch in snippet view article find links to article
Glow Discharge Optical Emission Spectrometry Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) X-Ray Photoelectron Spectroscopy (XPS) DNA synthesisLouis J. Cabri (1,628 words) [view diff] no match in snippet view article find links to article
techniques such as micro-Proton-induced X-ray emission (PIXE) and Secondary-Ion Mass Spectrometry (SIMS). His fundamental work on the platinum-group mineralsZircon (3,061 words) [view diff] no match in snippet view article find links to article
electrons can be used as a prescreening tool for high-resolution secondary-ion-mass spectrometry (SIMS) to image the zonation pattern and identify regions ofRichard D. Smith (1,877 words) [view diff] case mismatch in snippet view article find links to article
Chromatography-Mass Spectrometry with Electron Impact and Secondary Ion Mass Spectrometry with a Ribbon Storage Interface". Analytical Chemistry. 53Glass poling (894 words) [view diff] exact match in snippet view article find links to article
1364/OPEX.13.008015. PMID 19498831. Alley, T. G.; et al. (1999). "Secondary ion mass spectrometry study of space-charge formation in thermally poled fused silica"Liaoningosaurus (3,387 words) [view diff] exact match in snippet view article find links to article
between semi-arid and mesic conditions. Based on analyses using secondary ion mass spectrometry (SIMS) zircon U-Pb, the formation dates to the late BarremianVacuum pump (4,578 words) [view diff] exact match in snippet view article find links to article
1330–1333. ISBN 978-3-527-26954-9. Van der Heide, Paul (2014). Secondary ion mass spectrometry : an introduction to principles and practices. Hoboken, NewIoannis Liritzis (2,413 words) [view diff] exact match in snippet view article find links to article
(2002). "Towards a new method of obsidian hydration dating with secondary ion mass spectrometry via a surface saturation layer approach". Mediterranean ArchaeologyElectrodynamic tether (9,669 words) [view diff] exact match in snippet view article find links to article
J., "New wide angle, high transmission energy analyzer for secondary ion mass spectrometry," Review of Scientific Instrumentation, Vol. 52, No. 11, 1981Lomagundi-Jatuli Carbon Isotope Excursion (2,573 words) [view diff] exact match in snippet view article find links to article
high temperatures to measure the isotopic ratios of elements. Secondary ion mass spectrometry (SIMS) is a form of desorption mass spectrometry, which is