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searching for Circuit reliability 6 found (8 total)

alternate case: circuit reliability

Hardware stress test (1,421 words) [view diff] exact match in snippet view article find links to article

firm basis. Advanced Circuit Reliability Verification for Robust Design, a journal discuss the models used on circuit reliability verification and application
Yield (Circuit) (2,041 words) [view diff] exact match in snippet view article
Yield is a significant metric used in integrated circuit reliability engineering. It quantifies the proportion of manufactured chips that meet the required
Physics of failure (2,295 words) [view diff] case mismatch in snippet view article find links to article
Accurate Quantitative Physics-of-Failure Approach to Integrated Circuit Reliability, IPC APEX Expo, Las Vegas, NV, April 2011 Schuegraf and Hu, "A Model
Hot-carrier injection (1,785 words) [view diff] exact match in snippet view article find links to article
soon as the potential detrimental influence of HC injection on the circuit reliability was recognized, several fabrication strategies were devised to reduce
Semiconductor device (4,889 words) [view diff] case mismatch in snippet view article find links to article
Electronics portal Deep-level transient spectroscopy (DLTS) Integrated circuit Reliability (semiconductor) Schön scandal Semiconductor device fabrication Electronic
Igor L. Markov (2,996 words) [view diff] exact match in snippet view article find links to article
Krishnaswamy, George F. Viamontes, and John P. Hayes for work on circuit reliability evaluation with probabilistic transfer matrices. Full journal version