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searching for Circuit reliability 6 found (8 total)

Hardware stress test (1,421 words) [view diff] exact match in snippet view article find links to article

firm basis. Advanced Circuit Reliability Verification for Robust Design, a journal discuss the models used on circuit reliability verification and application

Yield (Circuit) (2,041 words) [view diff] exact match in snippet view article

Yield is a significant metric used in integrated circuit reliability engineering. It quantifies the proportion of manufactured chips that meet the required

Physics of failure (2,295 words) [view diff] case mismatch in snippet view article find links to article

Accurate Quantitative Physics-of-Failure Approach to Integrated Circuit Reliability, IPC APEX Expo, Las Vegas, NV, April 2011 Schuegraf and Hu, "A Model

Hot-carrier injection (1,785 words) [view diff] exact match in snippet view article find links to article

soon as the potential detrimental influence of HC injection on the circuit reliability was recognized, several fabrication strategies were devised to reduce

Semiconductor device (4,889 words) [view diff] case mismatch in snippet view article find links to article

Electronics portal Deep-level transient spectroscopy (DLTS) Integrated circuit Reliability (semiconductor) Schön scandal Semiconductor device fabrication Electronic

Igor L. Markov (2,996 words) [view diff] exact match in snippet view article find links to article

Krishnaswamy, George F. Viamontes, and John P. Hayes for work on circuit reliability evaluation with probabilistic transfer matrices. Full journal version