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searching for Physics of failure 10 found (18 total)

Quality and Reliability Engineering International (43 words) [view diff] exact match in snippet view article find links to article

includes the quality and reliability of components, equipment, and physics of failure. It covers the fields of electrical, mechanical, and systems engineering

Failure mode and effects analysis (5,576 words) [view diff] exact match in snippet view article find links to article

experience with similar products and processes—or based on common physics of failure logic. It is widely used in development and manufacturing industries

Aristos Christou (1,580 words) [view diff] no match in snippet view article find links to article

Aristos Christou is an American engineer and scientist, academic professor and researcher. He is a Professor of Materials Science, Professor of Mechanical

Mohammad Modarres (309 words) [view diff] case mismatch in snippet view article find links to article

the fields of nuclear and reliability engineering. Probabilistic Physics of Failure Approach to Reliability: Modeling, Accelerated Testing, Prognosis

Dye-and-pry (485 words) [view diff] case mismatch in snippet view article find links to article

November 2017. "Effective Reliability Test Plan Development using Physics of Failure" (PDF). Resources.dfrsolutions.com. Retrieved 22 November 2017.[permanent

Frede Blaabjerg (1,726 words) [view diff] no match in snippet view article find links to article

J. B. Jacobsen, T. Kvisgaard, J. Landkildehus, "Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics," IEEE Journal of Emerging

Prognostics (3,870 words) [view diff] exact match in snippet view article find links to article

remaining life prediction. For example, Khorasgani et al. modeled the physics of failure in electrolytic capacitors. Then, they used a particle filter approach

Signal-flow graph (10,170 words) [view diff] case mismatch in snippet view article find links to article

of flowgraph techniques to the solution of reliability problems". Physics of Failure in Electronics (AD434/329): 375–423. doi:10.1109/IRPS.1963.362257

Invention of the integrated circuit (9,046 words) [view diff] case mismatch in snippet view article find links to article

1966). "The Oxide-Silicon Interface". Fifth Annual Symposium on the Physics of Failure in Electronics: 199–231. doi:10.1109/IRPS.1966.362364. Sah 1988, p

History of the LED (5,525 words) [view diff] no match in snippet view article find links to article

of Organic Compounds in Microelectronics and Optoelectronics: From Physics-of-Failure to Physics-of-Degradation. Springer. January 31, 2022. ISBN 978-3-030-81576-9