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searching for SEMATECH 56 found (96 total)

alternate case: sEMATECH

Chris Mack (scientist) (312 words) [view diff] case mismatch in snippet view article

Microelectronics Research Laboratory of the NSA. After an assignment to Sematech, he quit his job at the NSA and founded FINLE Technologies (1990) to commercialize

Mary Gibbons Natrella (556 words) [view diff] exact match in snippet view article find links to article

Will (2003), "Origins of the NIST/SEMATECH e-Handbook of Statistical Methods in the Work of Mary Natrella", NIST/SEMATECH e-Handbook of Statistical Methods

Run chart (365 words) [view diff] exact match in snippet view article find links to article

Methods for Data Analysis. Duxbury. ISBN 0-534-98052-X.[page needed] NIST/SEMATECH (2003). "Run-Sequence Plot" In: e-Handbook of Statistical Methods 6/01/2003

Radar chart (2,497 words) [view diff] exact match in snippet view article find links to article

Content Strategy Workshops. March 3, 2015. Retrieved December 17, 2015. NIST/SEMATECH (2003). Star Plot in: e-Handbook of Statistical Methods. 6/01/2003 (Date

Robert McGrath (1,499 words) [view diff] exact match in snippet view article find links to article

Technologies; High Performance Computing Applications; Cooperative R&D with SEMATECH on microelectronics manufacturing; and other high priority programs. The

Statistical graphics (708 words) [view diff] exact match in snippet view article find links to article

Chart List of charting software Citations "The Role of Graphics". NIST/SEMATECH e-Handbook of Statistical Methods. 2003–2010. Retrieved May 5, 2011. Jacoby

Histogram (3,334 words) [view diff] exact match in snippet view article find links to article

Horrell. "Chi-square goodness-of-fit test". NIST/SEMATECH e-Handbook of Statistical Methods. NIST/SEMATECH. p. 7.2.1.1. Retrieved 29 March 2019. Moore, David

Regression validation (1,117 words) [view diff] exact match in snippet view article find links to article

of Michigan Press How can I tell if a model fits my data? (NIST) NIST/SEMATECH e-Handbook of Statistical Methods Model Diagnostics (Eberly College of

Statistical dispersion (936 words) [view diff] exact match in snippet view article find links to article

Precision (statistics) Robust measures of scale Summary statistics NIST/SEMATECH e-Handbook of Statistical Methods. "1.3.6.4. Location and Scale Parameters"

Pike Powers (701 words) [view diff] exact match in snippet view article find links to article

later attempted to retain) the Semiconductor Manufacturing Technology (SEMATECH), a public-private partnership jointly funded by the U.S. Dept. of Defense

Nelson rules (354 words) [view diff] exact match in snippet view article find links to article

for Quality, Quality Tools Engineering Statistics Handbook 6.3.2, NIST/SEMATECH e-Handbook of Statistical Methods National Institute of Standards and Technology

Observational study (1,614 words) [view diff] exact match in snippet view article find links to article

Rosenbaum PR (2002). Observational Studies (2nd ed.). New York: Springer-Verlag. ISBN 0387989676. "NIST/SEMATECH Handbook on Engineering Statistics" at NIST

Seasonality (2,523 words) [view diff] exact match in snippet view article find links to article

Seasonality at NIST/SEMATECH e-Handbook of Statistical Methods This article incorporates public domain material from NIST/SEMATECH e-Handbook of Statistical

Exponential smoothing (4,349 words) [view diff] exact match in snippet view article find links to article

average model (ARMA) Errors and residuals in statistics Moving average "NIST/SEMATECH e-Handbook of Statistical Methods". NIST. Retrieved 23 May 2010. Oppenheim

Contrast (statistics) (1,550 words) [view diff] exact match in snippet view article

research design and analysis (2nd ed.). Pacific Grove, CA: Duxbury/Thomson Learning. ISBN 0534368344. NIST/SEMATECH e-Handbook of Statistical Methods

X̅ and R chart (707 words) [view diff] case mismatch in snippet view article find links to article

standards are unknown) "Shewhart X-bar and R and S Control Charts". NIST/Sematech Engineering Statistics Handbook]. National Institute of Standards and Technology

Design of experiments (5,431 words) [view diff] exact match in snippet view article find links to article

library A chapter from a "NIST/SEMATECH Handbook on Engineering Statistics" at NIST Box–Behnken designs from a "NIST/SEMATECH Handbook on Engineering Statistics"

Tolerance interval (2,084 words) [view diff] case mismatch in snippet view article find links to article

intervals for a normal distribution". Engineering Statistics Handbook. NIST/Sematech. 2010. Retrieved 2011-08-26. De Gryze, S.; Langhans, I.; Vandebroek, M

Plot (graphics) (2,604 words) [view diff] exact match in snippet view article

material from the National Institute of Standards and Technology NIST/SEMATECH (2003). "The Role of Graphics". In: e-Handbook of Statistical Methods 6

P-chart (760 words) [view diff] case mismatch in snippet view article find links to article

count-based data. np-chart Individuals chart "Proportions Control Charts". NIST/Sematech Engineering Statistics Handbook. National Institute of Standards and Technology

X̅ and s chart (934 words) [view diff] case mismatch in snippet view article find links to article

standards are unknown) "Shewhart X-bar and R and S Control Charts". NIST/Sematech Engineering Statistics Handbook. National Institute of Standards and Technology

Berkeley Research Group (1,218 words) [view diff] exact match in snippet view article find links to article

several articles: “Estimating the Benefits from Collaboration: The Case of SEMATECH” by David Teece, which was cited in the Economic Report of the President

C-chart (364 words) [view diff] case mismatch in snippet view article find links to article

established during control-chart setup. u-chart "Counts Control Charts". NIST/Sematech Engineering Statistics Handbook. National Institute of Standards and Technology

Statistical process control (2,621 words) [view diff] exact match in snippet view article find links to article

- Control of Manufacturing Processes Guthrie, William F. (2012). "NIST/SEMATECH e-Handbook of Statistical Methods". National Institute of Standards and

Bartlett's test (687 words) [view diff] exact match in snippet view article find links to article

Eighth Edition, Iowa State University Press. ISBN 978-0-8138-1561-9 NIST/SEMATECH e-Handbook of Statistical Methods. Available online, URL: http://www.itl

Willis Adcock (792 words) [view diff] exact match in snippet view article find links to article

he contributed articles to professional journals and developed a novel SEMATECH Research Center of Excellence at the University. Adcock was a fellow of

Glossary of experimental design (1,928 words) [view diff] exact match in snippet view article find links to article

2017-12-28. Retrieved 2017-12-14. "A Glossary of DOE Terminology", NIST/SEMATECH e-Handbook of Statistical Methods, retrieved 20 March 2013 This article

Glossary of experimental design (1,928 words) [view diff] exact match in snippet view article find links to article

2017-12-28. Retrieved 2017-12-14. "A Glossary of DOE Terminology", NIST/SEMATECH e-Handbook of Statistical Methods, retrieved 20 March 2013 This article

Peter C. Schultz (558 words) [view diff] exact match in snippet view article find links to article

has provided consulting services to several companies (including Intel, SEMATECH International, Yazaki, Furukawa, IMRA and SPI Lasers plc) and expert witness

Bartlett's test (687 words) [view diff] exact match in snippet view article find links to article

Eighth Edition, Iowa State University Press. ISBN 978-0-8138-1561-9 NIST/SEMATECH e-Handbook of Statistical Methods. Available online, URL: http://www.itl

Defects per million opportunities (598 words) [view diff] case mismatch in snippet view article find links to article

costs or cost of poor quality (COPQ) "What is Process Capability?". NIST/Sematech Engineering Statistics Handbook. National Institute of Standards and Technology

Shewhart individuals control chart (1,166 words) [view diff] case mismatch in snippet view article find links to article

{\displaystyle {\overline {x}}} and s chart "Individuals Control Charts". NIST/Sematech Engineering Statistics Handbook]. National Institute of Standards and Technology

Seasonal subseries plot (571 words) [view diff] exact match in snippet view article find links to article

axis(1, at=1:12, labels=month.abb, cex=0.8) "Seasonal Subseries Plot". NIST/SEMATECH e-Handbook of Statistical Methods. National Institute of Standards and

Moving average (3,170 words) [view diff] exact match in snippet view article find links to article

Archived from the original on 2010-03-29. Retrieved 2010-10-26. NIST/SEMATECH e-Handbook of Statistical Methods: Single Exponential Smoothing at the

NASA ERAST Program (2,216 words) [view diff] case mismatch in snippet view article find links to article

Department of Commerce's precedent established for the Semiconductor industry, Sematech. The ERAST project used the innovative Joint Sponsored Research Agreement

Tukey's range test (1,548 words) [view diff] exact match in snippet view article find links to article

method". e-Handbook of Statistical Methods. itl.nist.gov/div898/handbook. SEMATECH. National Institute of Standards and Technology / U.S. Department of Commerce

Karen R. Hitchcock (1,913 words) [view diff] case mismatch in snippet view article find links to article

candidacies centered on the SUNY Chancellor's wresting of the highly touted Sematech North from Hitchcock's control. On February 25, 2005, the New York Times

Control chart (3,817 words) [view diff] exact match in snippet view article find links to article

ISBN 978-0-945320-53-1. Wikimedia Commons has media related to Control charts. NIST/SEMATECH e-Handbook of Statistical Methods Monitoring and Control with Control Charts

Desorptive capacity (1,855 words) [view diff] exact match in snippet view article find links to article

desorptive capacity-related practices at the network level – the case of SEMATECH". R&D Management. 42 (1): 90–99. doi:10.1111/j.1467-9310.2011.00668.x.

Data analysis (7,188 words) [view diff] exact match in snippet view article find links to article

Analysis: an Introduction, Sage Publications Inc, ISBN 0-8039-5772-6 NIST/SEMATECH (2008) Handbook of Statistical Methods Pyzdek, T, (2003). Quality Engineering

Exponential distribution (6,647 words) [view diff] exact match in snippet view article find links to article

Prentice Hall. ISBN 978-0-13-187715-3. Retrieved 10 August 2012. NIST/SEMATECH e-Handbook of Statistical Methods Elfessi, Abdulaziz; Reineke, David M

Metrology (6,034 words) [view diff] exact match in snippet view article find links to article

NIST. Retrieved 23 March 2018. "e-Handbook of Statistical Methods". NIST/SEMATECH. Retrieved 23 March 2018. International vocabulary of metrology – basic

Analysis of variance (7,645 words) [view diff] exact match in snippet view article find links to article

Latin squares, and their analysis in R (University of Southampton) NIST/SEMATECH e-Handbook of Statistical Methods, section 7.4.3: "Are the means equal

Local regression (5,833 words) [view diff] exact match in snippet view article find links to article

Nutrient Steps, July 2016. NIST, "LOESS (aka LOWESS)", section 4.1.4.4, NIST/SEMATECH e-Handbook of Statistical Methods, (accessed 14 April 2017) Henderson,

Poisson distribution (11,215 words) [view diff] exact match in snippet view article find links to article

3.3.1. Counts Control Charts". e-Handbook of Statistical Methods. NIST/SEMATECH. Retrieved 20 September 2019. Feller, William. An Introduction to Probability

Glossary of probability and statistics (4,051 words) [view diff] exact match in snippet view article find links to article

Wiktionary, the free dictionary. "A Glossary of DOE Terminology", NIST/SEMATECH e-Handbook of Statistical Methods, NIST, retrieved 28 February 2009 Statistical

Absorptive capacity (2,670 words) [view diff] exact match in snippet view article find links to article

desorptive capacity-related practices at the network level - the case of SEMATECH". R&D Management. 42 (1): 90–99. doi:10.1111/j.1467-9310.2011.00668.x.

Extreme ultraviolet lithography (14,636 words) [view diff] exact match in snippet view article find links to article

Fontaine, Bruno M (eds.). "Out-of-band exposure characterization with the SEMATECH Berkeley 0.3-NA microfield exposure tool". Journal of Micro/Nanolithography

Pearson's chi-squared test (5,767 words) [view diff] exact match in snippet view article find links to article

October 2014. "Critical Values of the Chi-Squared Distribution". NIST/SEMATECH e-Handbook of Statistical Methods. National Institute of Standards and

Kenneth L. Schroeder (1,648 words) [view diff] case mismatch in snippet view article find links to article

Genus, Semiconductor Equipment and Materials Institute (SEMI) and Semi-Sematech. Along with his wife, Fran Codispoti, Schroeder contributes financially

High-temperature operating life (2,838 words) [view diff] exact match in snippet view article find links to article

siliconfareast Comparing the Effectiveness of Stress-based Reliability Qualification Stress Conditions Reliability Hotwire eMagazine SEMATECH Handbook

Beta distribution (40,562 words) [view diff] exact match in snippet view article find links to article

benchmark results. Communications of the ACM, 29(3):218–221, March 1986. "NIST/SEMATECH e-Handbook of Statistical Methods 1.3.6.6.17. Beta Distribution". National

Additive disequilibrium and z statistic (951 words) [view diff] exact match in snippet view article find links to article

PMID 15911570. "7.1.3.1. Critical values and p values". www.itl.nist.gov. NIST SEMATECH. Retrieved 4 December 2017. "Tests of Significance". www.stat.yale.edu

Silicon Genesis Project (684 words) [view diff] exact match in snippet view article find links to article

Sam 2004 Texas Instruments, Computervision, Micronix, KLA Tencor, SEMI-SEMATECH Craig Addison Hartman, Robert 2018 Standard Oil, Rockwell, Electronic Arrays

Pete Klenow (2,052 words) [view diff] case mismatch in snippet view article find links to article

Peter J. (1996). "High-tech R&D Subsidies: Estimating the Effects of Sematech" (PDF). Journal of International Economics. 40 (3–4): 323–344. doi:10

Poly(phthalaldehyde) (4,686 words) [view diff] exact match in snippet view article

San Jose, California, USA. Clifford L. Henderson, SPIE, International SEMATECH. Bellingham, Wash.: SPIE. 2008. ISBN 978-0-8194-7108-6. OCLC 230813745