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searching for Ellipsometry 29 found (96 total)

Brian Hayden (212 words) [view diff] exact match in snippet view article find links to article

1984 developing surface sensitive optical spectroscopies, including ellipsometry and reflection absorption infra-red spectroscopy, for the investigation

Matthew Linford (1,010 words) [view diff] exact match in snippet view article find links to article

storage, and perform surface analysis by XPS, ToF-SIMS, wetting, optical ellipsometry, and FTIR. His lab also performs chemometrics of mass spectroscopic data

Aluminium acetylacetonate (160 words) [view diff] exact match in snippet view article find links to article

films deposited by MOCVD from aluminium acetylacetonate: a spectroscopic ellipsometry study" I. F. Henderson, A. P. Martin (1990). "Control of slugs with contact-action

Indium phosphide (754 words) [view diff] exact match in snippet view article find links to article

refractive index of InP and its oxide measured by multiple-angle incident ellipsometry", Journal of Materials Science Letters, 12 (10): 721, doi:10.1007/BF00626698

Forouhi–Bloomer model (1,130 words) [view diff] exact match in snippet view article find links to article

(2006). "Extraction of optical constants of zinc oxide thin films by ellipsometry with various models". Thin Solid Films. 510 (1–2): 32–38. Bibcode:2006TSF

Dual-polarization interferometry (997 words) [view diff] exact match in snippet view article find links to article

heterogeneous thin films measured with dual polarization interferometry and ellipsometry". RSC Advances. 3 (10): 3316. Bibcode:2013RSCAd...3.3316C. doi:10.1039/C2RA22911K

Max Planck Institute for Solid State Research (1,079 words) [view diff] exact match in snippet view article find links to article

spectroscopic methods such as high-resolution neutron spectroscopy and spectral ellipsometry. Research efforts in the Department of Nanoscale Science, directed by

Nano and Micro Devices Center (250 words) [view diff] exact match in snippet view article find links to article

Force Microscopy, Scanning Electron Microscopy, Confocal Microsocopy, Ellipsometry, UV, IR, and Raman Spectroscopy, X-ray Spectroscopy, and other techniques

Roger H. French (1,930 words) [view diff] exact match in snippet view article find links to article

has utilized VUV and optical spectroscopies, along with spectroscopic ellipsometry, to investigate the optical properties, electronic structure, and radiation

List of refractive indices (1,094 words) [view diff] exact match in snippet view article find links to article

{SiO2} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry" (PDF). Physical Review B. 72 (20): 205117. Bibcode:2005PhRvB..72t5117T

Microfabrication (2,111 words) [view diff] exact match in snippet view article find links to article

Spectra of CH3NH3PbI3 Perovskite Thin Films Determined by Spectroscopic Ellipsometry and Spectrophotometry". The Journal of Physical Chemistry Letters. 6

Bicyclohexyl (590 words) [view diff] exact match in snippet view article find links to article

M; Baltes, H; Helm, C. A; Pfohl, T; Riegler, H; Möhwald, H (1996). "Ellipsometry and X-ray Reflectivity Studies on Monolayers of Phosphatidylethanolamine

Amorphous silicon (2,776 words) [view diff] exact match in snippet view article find links to article

protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry". Solar Energy Materials and Solar Cells. 78 (1–4): 143–180. doi:10

Calcite (4,831 words) [view diff] exact match in snippet view article find links to article

anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry". Thin Solid Films. 313–314 (1–2): 341–346. Bibcode:1998TSF...313..341T

Coating (4,305 words) [view diff] exact match in snippet view article find links to article

semiconductors". Thin Solid Films. 5th International Conference on Spectroscopic Ellipsometry (ICSE-V). 519 (9): 2678–2681. Bibcode:2011TSF...519.2678C. doi:10.1016/j

Glycine (3,813 words) [view diff] exact match in snippet view article find links to article

"Determination of refractive index and layer thickness of nm-thin films via ellipsometry". Optics Express. 25 (22): 27077–27085. Bibcode:2003ApJ...593..848K.

F-center (2,789 words) [view diff] exact match in snippet view article find links to article

radiation damage of the KCL surface—application of combined spectroscopic ellipsometry and reflectometry". Surface Science. 74 (3): 568. Bibcode:1978SurSc.

Ultraviolet–visible spectroscopy (4,421 words) [view diff] exact match in snippet view article find links to article

Spectra of CH3NH3PbI3 Perovskite Thin Films Determined by Spectroscopic Ellipsometry and Spectrophotometry". The Journal of Physical Chemistry Letters. 6

Effective mass (solid-state physics) (3,717 words) [view diff] exact match in snippet view article

effective masses of Silicon at different temperatures. M. Schubert, Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons,

Institute of Physics Azerbaijan National Academy of Sciences (466 words) [view diff] exact match in snippet view article find links to article

diagnostics of semiconductor structures; Laboratory of Spectroscopic Ellipsometry; Nuclear Research Laboratory; Laboratory of High energy physics; Laboratory

Periodic table (27,136 words) [view diff] exact match in snippet view article find links to article

(2018). "The direct bandgap of gray α-tin investigated by infrared ellipsometry". Applied Physics Letters. 113 (23): 232104. Bibcode:2018ApPhL.113w2104C

Solvent vapour annealing (1,495 words) [view diff] exact match in snippet view article find links to article

the swollen and dried states of the BCP. Using methods such as also ellipsometry and interferometry can lead to discoveries about the thickness of the

Solar cell (16,405 words) [view diff] exact match in snippet view article find links to article

protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry". Solar Energy Materials and Solar Cells. 78 (1–4): 143. Bibcode:2003SEMSC

Gibbs isotherm (2,783 words) [view diff] exact match in snippet view article find links to article

the validity of the model: two different techniques are normally used: ellipsometry and following the decay of 14C present in the surfactant molecules. Ionic

Effective medium approximations (4,353 words) [view diff] exact match in snippet view article find links to article

Battie, Y.; Stchakovsky, M., En Naciri, A.; Akil, S., Chaoui, N. (2017). "Ellipsometry of Colloidal solutions: New experimental setup and application to metallic

Directed assembly of micro- and nano-structures (1,563 words) [view diff] exact match in snippet view article find links to article

directed self-assembly patterning using Mueller matrix spectroscopic ellipsometry based scatterometry (Thesis). ProQuest 1712665182. Van Look, Lieve; Rincon

Ogtay Samadov (1,346 words) [view diff] exact match in snippet view article find links to article

DOI 10.1002/ pssc. 201400366. 18. Temperature dependent spectroscopic ellipsometry of AgSe and AgS with phase transitions from ionic to superionic conductivity

Surface chemistry of neural implants (4,781 words) [view diff] exact match in snippet view article find links to article

deviation from the mean plane. - Protein was measured in vitro with ellipsometry and step-technique atomic force microscopy, with metal in a dilute plasma

Giant birefringence (2,299 words) [view diff] exact match in snippet view article find links to article

Multilayer Transition Metal Dichalcogenides Measured by Spectroscopic Ellipsometry in the 300–1700 nm Range: High Index, Anisotropy, and Hyperbolicity"