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searching for Device under test 52 found (94 total)

Dielectric withstand test (439 words) [view diff] exact match in snippet view article find links to article

safely during rated electrical conditions. If the current through a device under test is less than a specified limit at the required test potential and

Arbitrary waveform generator (621 words) [view diff] exact match in snippet view article find links to article

(internal or external). The resulting waveforms can be injected into a device under test and analyzed as they progress through it, confirming the proper operation

Design for testing (1,995 words) [view diff] exact match in snippet view article find links to article

with the response of vectors (using the same patterns) from a DUT (device under test). If the response is the same or matches, the circuit is good. Otherwise

Automated optical inspection (861 words) [view diff] exact match in snippet view article find links to article

LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality

Near-field scanner (531 words) [view diff] exact match in snippet view article find links to article

single or multiple field probes acquired in the near-field region of a device under test possibly accompanied by the associated numerical post-processing methods

Sweep generator (440 words) [view diff] exact match in snippet view article find links to article

amplitude is varied. Typically the amplitude and distortion of the device under test are measured. This is also referred to as an "amplitude sweep". In

Transistor tester (389 words) [view diff] exact match in snippet view article find links to article

the process of systematically varying the impedance presented to a device under test Earl D. Gates (2000). Introduction to Electronics: A Practical Approach

Electron beam prober (357 words) [view diff] no match in snippet view article find links to article

continuously looping, repeating test pattern must be applied to the device-under-test (DUT). E-beam probers are used primarily for front side semiconductor

Automatic test switching (1,760 words) [view diff] exact match in snippet view article find links to article

test system would involve connecting the input and outputs of the device under test to the test equipment, which is usually controlled by an electronic

Time-resolved photon emission (317 words) [view diff] no match in snippet view article find links to article

on the back side of the semiconductor device. The substrate of the device-under-test (DUT) must first be thinned mechanically. The device is mounted on

Load pull (367 words) [view diff] exact match in snippet view article find links to article

the process of systematically varying the impedance presented to a device under test (DUT), most often a transistor, to assess its performance and the

Audio analyzer (1,856 words) [view diff] exact match in snippet view article find links to article

specific tests and confirmations. Audio analysis requires that the device under test receive a stimulus signal of known characteristics, with which the

Cheesecloth (623 words) [view diff] exact match in snippet view article find links to article

for potential fire hazards. Cheesecloth is wrapped tightly over the device under test, which is then subjected to simulated conditions such as lightning

Multimeter (6,838 words) [view diff] exact match in snippet view article find links to article

small battery within the instrument to pass a current through the device under test and the meter coil. Since the current available depends on the state

Microwave imaging (2,034 words) [view diff] exact match in snippet view article find links to article

attached or in a small distance, is moved over the surface of the device under test. This can be done manually or automatically. The test probe transmits

Two-tone testing (1,660 words) [view diff] exact match in snippet view article find links to article

two-tone testing is most commonly done by examining the output of the device under test (DUT) with a spectrum analyser with which intermodulation products

Vibration (7,227 words) [view diff] exact match in snippet view article find links to article

a DUT (device under test) is attached to the "table" of a shaker. Vibration testing is performed to examine the response of a device under test (DUT) to

Thermal laser stimulation (843 words) [view diff] no match in snippet view article find links to article

resulting in open metal lines. A constant voltage is applied to the device-under-test (DUT). An area of interest is selected on the device, and a laser

Electromagnetic compatibility (3,278 words) [view diff] exact match in snippet view article find links to article

field strengths are near-field effects and are only important if the device under test (DUT) is designed for a location close to other electrical equipment

Universal Verification Methodology (1,050 words) [view diff] case mismatch in snippet view article find links to article

and DUT The entire DUT scenario generation In this stage the DUT (Device Under Test) and the test bench environment should be set to the desired initial

APC-7 connector (644 words) [view diff] exact match in snippet view article find links to article

tests. Modern network analyzers focus on the reference plane near the device under test and have features such as automated calibration, adapter removal,

Goniophotometer (542 words) [view diff] exact match in snippet view article find links to article

time required to obtain the luminous intensity distribution of the device under test, and is not affected by the angular resolution set for the measurement

Transformer oil (1,785 words) [view diff] exact match in snippet view article find links to article

insulating property of the dielectric oil, an oil sample is taken from the device under test, and its breakdown voltage is measured on-site according to the following

Horn analyzer (358 words) [view diff] exact match in snippet view article find links to article

frequency sweep while monitoring the current flowing through the device under test, in order to detect the resonance and anti-resonance frequencies and

VCX score (986 words) [view diff] exact match in snippet view article find links to article

device to capture colors closely matching the original scene The device under test is mounted on a tripod on rails to keep the reproduction scale constant

Noise-figure meter (775 words) [view diff] exact match in snippet view article find links to article

gated broadband noise source (such as an avalanche diode) drives the device under test. A measurement is made with the noise source on; another measurement

Circuit Check (478 words) [view diff] exact match in snippet view article find links to article

test probe (a.k.a. "pogo pin") exerts several ounces of force on the device under test (DUT). When the test fixture has thousands of test probes, the sum

Power rating (1,749 words) [view diff] exact match in snippet view article find links to article

amplifier power ratings are typically established by driving the device under test to the onset of clipping, to a predetermined distortion level, variable

Impedance analyzer (476 words) [view diff] exact match in snippet view article find links to article

the phase sensitive measurement of current and voltage applied to a device under test while the measurement frequency is varied over the course of the measurement

Source measure unit (858 words) [view diff] exact match in snippet view article find links to article

instrument autonomy. Contact check—SMUs can verify good connections to the device under test before the test begins. Some of the problems this function can detect

Electrical treeing (1,392 words) [view diff] exact match in snippet view article find links to article

discharge mapping format. Additional useful information about the device under test can be derived from a phase related depiction of the partial discharges

Electronic system-level design and verification (884 words) [view diff] exact match in snippet view article find links to article

usually modified or customized to better accommodate the system or device under test. Common ESL verification methods include, but are not limited to:

Helium mass spectrometer (1,366 words) [view diff] exact match in snippet view article find links to article

This method applies to objects that are supposedly sealed. First the device under test will be exposed for an extended length of time to a high helium pressure

Electrical impedance (5,220 words) [view diff] exact match in snippet view article find links to article

impedance is adjusted to balance off the effect of the impedance of the device under test. Impedance measurement in power electronic devices may require simultaneous

Automatic test pattern generation (1,903 words) [view diff] exact match in snippet view article find links to article

the device's primary outputs, while applying a test pattern to some device under test (DUT), are called the output of that test pattern. The output of a

Hardware description language (3,616 words) [view diff] exact match in snippet view article find links to article

minimum, a testbench contains an instantiation of the model (called the device under test or DUT), pin/signal declarations for the model's I/O, and a clock

Ground (electricity) (5,600 words) [view diff] exact match in snippet view article

with one hand behind their back" to avoid touching two parts of the device under test at the same time, thereby preventing a current from crossing through

Orthomode transducer (1,929 words) [view diff] exact match in snippet view article find links to article

Characterization of a manufactured OMT (considered the device under test, DUT) is usually a delicate matter for both mechanical and theoretical

Probe card (1,252 words) [view diff] exact match in snippet view article find links to article

the wafer, and using this information it will align the pads on the device under test (DUT) to the probe card contacts. Probe cards are broadly classified

Space mapping (2,488 words) [view diff] exact match in snippet view article find links to article

physics-based model, quasi-global model, physically expressive model, device under test, electromagnetics-based model, simulation model, computational model

Data plane (2,141 words) [view diff] exact match in snippet view article find links to article

document. A classic RFC 2544 benchmark uses half the router's (i.e., the device under test (DUT)) ports for input of a defined load, and measures the time at

Y.1564 (1,999 words) [view diff] exact match in snippet view article find links to article

condition. This subtest is performed by temporarily oversubscribing the device under test and then reducing the throughput at normal or low load while measuring

Allan variance (9,353 words) [view diff] exact match in snippet view article find links to article

comparison of two different clocks. Consider a reference clock and a device under test (DUT), and both having a common nominal frequency of 10 MHz. A time-interval

Third-order intercept point (1,819 words) [view diff] exact match in snippet view article find links to article

dependency on frequency and tone spacing, depending on the physics of the device under test. One of the useful applications of third-order intercept point is

Avometer (2,222 words) [view diff] exact match in snippet view article find links to article

the instrument and could be used to control the current through a device under test and the meter. The movement drew 12 mA for full-scale deflection and

Scanning SQUID microscopy (5,449 words) [view diff] exact match in snippet view article find links to article

SQUID, made from YBa2Cu3O7, cooled below 80K and in vacuum while the device under test is at room temperature and in air. A SQUID consists of two Josephson

IEC 61000-4-5 (2,669 words) [view diff] no match in snippet view article find links to article

conditions. Subsequently, the surge is transmitted into a port of the Device-Under-Test (DUT) via a coupling network. Finally, to prevent surges from reaching

Y.156sam (1,867 words) [view diff] exact match in snippet view article find links to article

condition. This subtest is performed by temporarily oversubscribing the device under test and then reducing the throughput at normal or low load while measuring

Solar simulator (4,338 words) [view diff] exact match in snippet view article find links to article

equipment is often used to prevent unnecessary heat build-up in the device under test. However, due to the rapid heating and cooling of the lamp, the intensity

CMOS amplifier (2,445 words) [view diff] exact match in snippet view article find links to article

current of cells or solutions to define the characteristics of a device under test In the last decade[when?], circuit designers have proposed different

Run-time estimation of system and sub-system level power consumption (6,758 words) [view diff] exact match in snippet view article find links to article

result, LEAP eliminates the need for synchronization between the device under test and an external power measurement unit. LEAP also provides power information

Software load testing (1,200 words) [view diff] exact match in snippet view article find links to article

suitability for use of any given software. In the example above, while the device under test (DUT) is under production load - 100 VUsers, run the target application