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Longer titles found: Logic built-in self-test (view)

searching for Built-in self-test 16 found (39 total)

Halt and Catch Fire (computing) (2,668 words) [view diff] exact match in snippet view article

limited number of high-address lines). HCF is believed to be the first built-in self-test feature on a Motorola microprocessor. The Intel 8086 and subsequent

Irith Pomeranz (280 words) [view diff] no match in snippet view article find links to article

current research includes: Test generation, design for testability, built in self test and diagnosis of integrated circuits. Pomeranz is a 1985 graduate

Yervant Zorian (297 words) [view diff] exact match in snippet view article find links to article

Integrated circuit testing. He is an IEEE Fellow for contributions to built-in self-test of complex devices and systems since 1999. Zorian won the 2005 Hans

Avalanche (video game) (456 words) [view diff] exact match in snippet view article

languages: English, French, German, or Spanish. Avalanche also includes a built-in self-test diagnostic program that displays all microprocessor and memory functions

POWER4 (700 words) [view diff] no match in snippet view article find links to article

used for First Failure Data Capture, is provided. There is also a Built In Self Test function (BIST) and Performance Monitoring Unit (PMU). Power-on reset

Circuit design (2,355 words) [view diff] no match in snippet view article find links to article

2007-11-04. "A.T.E. Solutions, Inc. | Design for Testability and for Built-In Self Test". Besttest.com. Archived from the original on 2016-09-01. Retrieved

SGI Challenge (1,366 words) [view diff] exact match in snippet view article find links to article

single-bit errors and detect double-bit errors. The SIMMs also contain built-in self-test circuitry, which tests the SIMM during power on or reset and alerts

Computer Automation (1,804 words) [view diff] no match in snippet view article find links to article

converters. The SCOUT had many advanced features for its time including built-in self test diagnostics, a plug-and-play driver and bootloader facility, and automatic

Atari 8-bit computers (8,354 words) [view diff] no match in snippet view article find links to article

1983. It shipped in March[citation needed] 1983 with 64 KB of RAM, built-in self test, a redesigned keyboard (with four function keys and a HELP key), and

Umkhonto (missile) (2,714 words) [view diff] exact match in snippet view article

using an auxiliary vessel. High reliability is achieved through the built-in self-test hardware that provides the minimum cost of maintenance staff. Research

Computational RAM (1,239 words) [view diff] exact match in snippet view article find links to article

(magazine). 1997. says "Vector IRAM ... can operate as a parallel built-in self-test engine for the memory array, significantly reducing the DRAM testing

Number Five Crossbar Switching System (3,395 words) [view diff] exact match in snippet view article find links to article

ensure that exactly two out of the five lines are activated. When the built-in self-test circuits of a marker detect an error, a large punch card is produced

Reliability engineering (13,236 words) [view diff] exact match in snippet view article find links to article

applications, but can commonly include: Physics of failure (PoF) Built-in self-test (BIT or BIST) (testability analysis) Failure mode and effects analysis

Motorola 6800 (9,511 words) [view diff] case mismatch in snippet view article find links to article

Motorola. 1976. Daniels, R. Gary; William C. Bruce (April 1985). "Built-In Self-Test Trends in Motorola Microprocessors". IEEE Design & Test of Computers

List of fellows of IEEE Circuits and Systems Society (78 words) [view diff] exact match in snippet view article find links to article

digital signal processing. 1999 Yervant Zorian For contributions to built-in self-test of complex devices and systems. 2000 Mani Soma For contributions to

List of fellows of IEEE Computer Society (104 words) [view diff] no match in snippet view article find links to article

Savir For contributions to the theory, design, and applications of built-in-self-test systems (BIST). 1994 Alexander Sawchuk For contributions to digital