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searching for Device under test 55 found (96 total)

alternate case: device under test

Dielectric withstand test (435 words) [view diff] exact match in snippet view article find links to article

safely during rated electrical conditions. If the current through a device under test is less than a specified limit at the required test potential and
Automated optical inspection (513 words) [view diff] exact match in snippet view article find links to article
LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality
Design for testing (2,003 words) [view diff] exact match in snippet view article find links to article
with the response of vectors (using the same patterns) from a DUT (device under test). If the response is the same or matches, the circuit is good. Otherwise
Transistor tester (389 words) [view diff] exact match in snippet view article find links to article
the process of systematically varying the impedance presented to a device under test Earl D. Gates (2000). Introduction to Electronics: A Practical Approach
Arbitrary waveform generator (626 words) [view diff] exact match in snippet view article find links to article
(internal or external). The resulting waveforms can be injected into a device under test and analyzed as they progress through it, confirming the proper operation
Near-field scanner (532 words) [view diff] exact match in snippet view article find links to article
single or multiple field probes acquired in the near-field region of a device under test possibly accompanied by the associated numerical post-processing methods
Sweep generator (440 words) [view diff] exact match in snippet view article find links to article
amplitude is varied. Typically the amplitude and distortion of the device under test are measured. This is also referred to as an "amplitude sweep". In
Electron beam prober (357 words) [view diff] no match in snippet view article find links to article
continuously looping, repeating test pattern must be applied to the device-under-test (DUT). E-beam probers are used primarily for front side semiconductor
Automatic test switching (1,809 words) [view diff] exact match in snippet view article find links to article
test system would involve the connection of input and outputs of the device under test to the test equipment, which is usually controlled by an electronic
Time-resolved photon emission (320 words) [view diff] no match in snippet view article find links to article
on the back side of the semiconductor device. The substrate of the device-under-test (DUT) must first be thinned mechanically. The device is mounted on
Audio analyzer (1,854 words) [view diff] exact match in snippet view article find links to article
specific tests and confirmations. Audio analysis requires that the device under test receive a stimulus signal of known characteristics, with which the
Load pull (367 words) [view diff] exact match in snippet view article find links to article
the process of systematically varying the impedance presented to a device under test (DUT), most often a transistor, to assess its performance and the
Cheesecloth (582 words) [view diff] exact match in snippet view article find links to article
for potential fire hazards. Cheesecloth is wrapped tightly over the device under test, which is then subjected to simulated conditions such as lightning
Multimeter (6,858 words) [view diff] exact match in snippet view article find links to article
small battery within the instrument to pass a current through the device under test and the meter coil. Since the current available depends on the state
Microwave imaging (1,916 words) [view diff] exact match in snippet view article find links to article
attached or in a small distance, is moved over the surface of the device under test. This can be done manually or automatically. The test probe transmits
Two-tone testing (1,660 words) [view diff] exact match in snippet view article find links to article
two-tone testing is most commonly done by examining the output of the device under test (DUT) with a spectrum analyser with which intermodulation products
Vibration (6,996 words) [view diff] exact match in snippet view article find links to article
a DUT (device under test) is attached to the "table" of a shaker. Vibration testing is performed to examine the response of a device under test (DUT) to
Thermal laser stimulation (833 words) [view diff] no match in snippet view article find links to article
resulting in open metal lines. A constant voltage is applied to the device-under-test (DUT). An area of interest is selected on the device, and a laser
Electromagnetic compatibility (3,264 words) [view diff] exact match in snippet view article find links to article
field strengths are near-field effects, and are only important if the device under test (DUT) is designed for location close to other electrical equipment
Universal Verification Methodology (1,006 words) [view diff] case mismatch in snippet view article find links to article
and DUV The entire DUV scenario generation In this stage the DUT (Device Under Test) and the environment it is in should be set to the conditions desired
Phase noise (1,457 words) [view diff] exact match in snippet view article find links to article
can be measured using a spectrum analyzer if the phase noise of the device under test (DUT) is large with respect to the spectrum analyzer's local oscillator
APC-7 connector (605 words) [view diff] exact match in snippet view article find links to article
tests. Modern network analyzers focus on the reference plane near the device under test and have features such as automated calibration, adapter removal,
Transformer oil (1,792 words) [view diff] exact match in snippet view article find links to article
insulating property of the dielectric oil, an oil sample is taken from the device under test, and its breakdown voltage is measured on-site according to the following
Goniophotometer (542 words) [view diff] exact match in snippet view article find links to article
time required to obtain the luminous intensity distribution of the device under test, and is not affected by the angular resolution set for the measurement
ISCSI Conformance Testing and Testing Tool Requirement (1,364 words) [view diff] case mismatch in snippet view article find links to article
bed, these tests provide a reasonable level of confidence that the Device Under Test (DUT) will function properly in many iSCSI environments. iSCSI conformance
VCX score (986 words) [view diff] exact match in snippet view article find links to article
device to capture colors closely matching the original scene The device under test is mounted on a tripod on rails to keep the reproduction scale constant
Horn analyzer (358 words) [view diff] exact match in snippet view article find links to article
frequency sweep while monitoring the current flowing through the device under test, in order to detect the resonance and anti-resonance frequencies and
Power rating (1,729 words) [view diff] exact match in snippet view article find links to article
amplifier power ratings are typically established by driving the device under test to the onset of clipping, to a predetermined distortion level, variable
Noise-figure meter (775 words) [view diff] exact match in snippet view article find links to article
gated broadband noise source (such as an avalanche diode) drives the device under test. A measurement is made with the noise source on; another measurement
Circuit Check (478 words) [view diff] exact match in snippet view article find links to article
test probe (a.k.a. "pogo pin") exerts several ounces of force on the device under test (DUT). When the test fixture has thousands of test probes, the sum
Impedance analyzer (476 words) [view diff] exact match in snippet view article find links to article
the phase sensitive measurement of current and voltage applied to a device under test while the measurement frequency is varied over the course of the measurement
Source measure unit (858 words) [view diff] exact match in snippet view article find links to article
instrument autonomy. Contact check—SMUs can verify good connections to the device under test before the test begins. Some of the problems this function can detect
Electrical impedance (4,733 words) [view diff] exact match in snippet view article find links to article
impedance is adjusted to balance off the effect of the impedance of the device under test. Impedance measurement in power electronic devices may require simultaneous
Electrical treeing (1,385 words) [view diff] exact match in snippet view article find links to article
discharge mapping format. Additional useful information about the device under test can be derived from a phase related depiction of the partial discharges
Electronic system-level design and verification (884 words) [view diff] exact match in snippet view article find links to article
usually modified or customized to better accommodate the system or device under test. Common ESL verification methods include, but are not limited to:
Helium mass spectrometer (1,358 words) [view diff] exact match in snippet view article find links to article
This method applies to objects that are supposedly sealed. First the device under test will be exposed for an extended length of time to a high helium pressure
Ground (electricity) (5,301 words) [view diff] exact match in snippet view article
with one hand behind their back" to avoid touching two parts of the device under test at the same time, thereby preventing a current from crossing through
Hardware description language (3,569 words) [view diff] exact match in snippet view article find links to article
minimum, a testbench contains an instantiation of the model (called the device under test or DUT), pin/signal declarations for the model's I/O, and a clock
Orthomode transducer (1,832 words) [view diff] exact match in snippet view article find links to article
Characterization of a manufactured OMT (considered the device under test, DUT) is usually a delicate matter for both mechanical and theoretical
Open Charge Point Protocol (1,038 words) [view diff] case mismatch in snippet view article find links to article
America, Europe and in Asia. To become OCPP certified, the tested Device Under Test (DUT), must successfully pass the following two categories of tests:
Automatic test pattern generation (1,903 words) [view diff] exact match in snippet view article find links to article
the device's primary outputs, while applying a test pattern to some device under test (DUT), are called the output of that test pattern. The output of a
Space mapping (2,580 words) [view diff] exact match in snippet view article find links to article
physics-based model, quasi-global model, physically expressive model, device under test, electromagnetics-based model, simulation model, computational model
Probe card (1,252 words) [view diff] exact match in snippet view article find links to article
the wafer, and using this information it will align the pads on the device under test (DUT) to the probe card contacts. Probe cards are broadly classified
Forwarding plane (2,141 words) [view diff] exact match in snippet view article find links to article
document. A classic RFC 2544 benchmark uses half the router's (i.e., the device under test (DUT)) ports for input of a defined load, and measures the time at
Y.1564 (1,999 words) [view diff] exact match in snippet view article find links to article
condition. This subtest is performed by temporarily oversubscribing the device under test and then reducing the throughput at normal or low load while measuring
Allan variance (8,901 words) [view diff] exact match in snippet view article find links to article
comparison of two different clocks. Consider a reference clock and a device under test (DUT), and both having a common nominal frequency of 10 MHz. A time-interval
IEC 61000-4-5 (2,621 words) [view diff] no match in snippet view article find links to article
conditions. Subsequently, the surge is transmitted into a port of the Device-Under-Test (DUT) via a coupling network. Finally, to prevent surges from reaching
Third-order intercept point (1,753 words) [view diff] exact match in snippet view article find links to article
dependency on frequency and tone spacing, depending on the physics of the device under test. One of the useful applications of third-order intercept point is
Avometer (2,222 words) [view diff] exact match in snippet view article find links to article
the instrument and could be used to control the current through a device under test and the meter. The movement drew 12 mA for full-scale deflection and
Y.156sam (1,867 words) [view diff] exact match in snippet view article find links to article
condition. This subtest is performed by temporarily oversubscribing the device under test and then reducing the throughput at normal or low load while measuring
Scanning SQUID microscopy (5,419 words) [view diff] exact match in snippet view article find links to article
SQUID, made from YBa2Cu3O7, cooled below 80K and in vacuum while the device under test is at room temperature and in air. A SQUID consists of two Josephson
Solar simulator (4,143 words) [view diff] exact match in snippet view article find links to article
equipment is often used to prevent unnecessary heat build-up in the device under test. However, due to the rapid heating and cooling of the lamp, the intensity
CMOS amplifier (2,418 words) [view diff] exact match in snippet view article find links to article
current of cells or solutions to define the characteristics of a device under test In the last decade[when?], circuit designers have proposed different
Run-time estimation of system and sub-system level power consumption (6,758 words) [view diff] exact match in snippet view article find links to article
result, LEAP eliminates the need for synchronization between the device under test and an external power measurement unit. LEAP also provides power information
Software load testing (1,131 words) [view diff] exact match in snippet view article find links to article
suitability for use of any given software. In the example above, while the device under test (DUT) is under production load - 100 VUsers, run the target application